product details
Theta Flex Optical Contact Angle 3D Topography Analyzer
The Theta Flex Optical Contact Angle 3D Topography Analyzer is a product that combines 3D surface roughness measurement and contact angle measurement, allowing for precise measurement of these two parameters at the same location on the sample.
OneAttention software automatically calculates roughness correction contact angle and surface free energy
Fully automatic measurement only takes a few seconds, simple operation, automatic operation and analysis
• Distinguish the effects of various coating formulations and surface modifications on surface chemistry and roughness
technology
Wettability is usually studied by contact angle measurement, which is defined by the Young equation on an ideal surface. The surface free energy theory is also based on the assumption of calculating using the Young contact angle. Therefore, the surface is assumed to be chemically uniform and smooth, but the real surface is not so. Surface roughness enhances existing wetting behavior and affects adhesion. The Theta Flex optical contact angle measuring instrument, combined with a 3D morphology module, can define the measurement of Young's contact angle and surface free energy, as well as measure rough surfaces based on Wenzel theory.
The contact angle on an ideal surface is called the Young contact angle | Contact angle displayed or measured on a real surface |
The 3D shape module is a high-resolution 3D shape acquisition system that uses stripe projection phase-shifting technology. The phase shifted stripe illumination pattern is sequentially projected onto the surface under study. The digital camera captures the stripe pattern and reconstructs the three-dimensional shape of the object through phase shift encoding. Based on the three-dimensional shape of the object, the two-dimensional and three-dimensional roughness parameters are calculated.
Optical View 2D View 3D View
Selection Guide



Product parameters
parameter
METHOD | Based on the principle of stripe projection phase shift |
XY pixel size | 1.1 μm x 1.1 μm |
Z-direction measurement range | 1 μm – 60 μm |
Sampling area | 1.41 mm x 1.06 mm (XY). (Maximum up to: 4.2 mm x 4.2 mm) |
work distance | 18 mm |
Upper limit of sample size | Infinite x 320 mm x 22 mm (L x W x H) |
imaging options | Optical images, 2D roughness map, 3D roughness chart |
Duration of each measurement | 5-30 s |
Analysis parameters (ISO 4287, ISO 4288) | R (Wenzel equation); θc, Roughness correction contact angle/Wenzel contact angle; Sdr (%), Sa (μm), Sq (μm); Ra in horizontal, vertical, and 2D linear regions, Rq,Rp, Rv, Rz, R10z |
Ripple filtration | Gaussian high pass filter (ISO 11562) |
Sample requirements/limitations | Need diffuse reflection surface |
hardware
size | 17 cm x 16.5 cm x 11.5 cm |
weight | 2.6 kg |
voltage | 100~240 VAC |
frequency | 50-60 Hz |
system requirements
computer | 2G processor, 4G memory, 500g hard drive, 1920x1080 resolution display, 1 USB 3.0 port |
Configuration required | XYZ fully automatic sample stage |